EFFECT OF IONIZATION RADIATION ON SEMICONDUCTOR LASER PARAMETERS
The reliability of laser diodes for use in space applications is studied. In the experiment, the field of gamma radiation was chosen
as the radiation environment affecting the laser diodes, and the effect of radiation on the noise parameter of the semiconductor
laser and their reproducibility were studied.
1. R. Hou, S. Zhao, Z. Yao, J. Xu, X. Li, and S. Fang, “Influence on the bit error ratio of the optical satellite communication
system under space radiation environment,” 2012 Symposium on Photonics and Optoelectronics, SOPO 2012, 2012.
2. H. Lischka, H. Henschel, O. Koehn, W. Lennartz, S. Metzger, and H. U. Schmidt, “Gamma and neutron irradiation of
optoelectronic devices,” Proceedings of the
3. European Conference on Radiation and its Effects on Components and Systems, RADECS, pp. 560–563, 1995.
4. C. C. Phifer, “Effects of Radiation on Laser Diodes,” no. No. SAND2004-4725, pp. 1-30, 2004.
5. Johnston A. H., “Radiation effects in light-emitting and laser diodes,” IEEE Transactions on Nuclear Science, vol. 50 III,
no. 3, pp. 689–703, 2003.
6. Johnston A. H., “Radiation effects in optoelectronic devices,” IEEE Transactions on Nuclear Science, vol. 60, no. 3, pp.
2054-2073, 2013.
7. Liu Y., Zhao S., Yang S., Li Y., and Qiang R., “Reliability of laser diodes for laser satellite communication in space
radiation environment,” 2588–2590, 2015.
8. Boutillier M. et al., “Strong electron irradiation hardness of 852 nm Al-free laser diodes,” Microelectronics Reliability, vol.
46, no. 9–11, pp. 1715–1719, 2006.
9. L. Adams A. Holmes-Siedle. Handbook of Radiation Effects. Oxford University Press, 2004.
10. F. Giustino. Radiation Effects on Semiconductor Devices, Study of the Enhanced Low Dose Rate Degradation. PhD thesis,
Politechnico di Torino, 2001.
11. R.A.B. Devine. The structure of SiO2, its defects and radiation hardness. IEEE Transactions on Nuclear Science, 41(3),
1994, pages 452-459.C. E. Barnes, D. M. Fleetwood, D. C. Shaw, and P. S. Winokur. Post irradiation effects (PIE) in
integrated circuits. IEEE Transactions on Nuclear Science, 39(3), 1992, pages 328–341.
12. G. Messenger and M. Ash. The Effects of Radiation on Electronic Systems. Van Nostrand Reinhold Company Inc., 1986.
13. C. E. Barnes, D. M. Fleetwood, D. C. Shaw, and P. S. Winokur. Post irradiation effects (PIE) in integrated circuits. IEEE
Transactions on Nuclear Science, 39(3), 1992, pages 328–341.
14. H. Lischka, H. Henschel, O. Koehn, W. Lennartz, S. Metzger, and H. U. Schmidt, “Gamma and neutron irradiation of
optoelectronic devices,” Proceedings of the European Conference on Radiation and its Effects on Components and
Systems, RADECS, pp. 560-563, 1995.
15. C. C. Phifer, “Effects of Radiation on Laser Diodes,” no. No. SAND2004-4725, pp. 1-30, 2004.
16. Johnston A. H., “Radiation effects in light-emitting and laser diodes,” IEEE Transactions on Nuclear Science, vol. 50 III,
no. 3, pp. 689–703, 2003.
17. Johnston A. H., “Radiation effects in optoelectronic devices,” IEEE Transactions on Nuclear Science, vol. 60, no. 3, pp.
2054-2073, 2013.
18. O. Gilard and G. Quadri. Radiation effects on electronics: displacement damages. New Challenges for Radiation Tolerance
Assessment, Radiation Effects on Components and Systems, 2005, pages 47-69.
19. R.D.Schrimpf. Recent advances in understanding total-dose effects in bipolar transistors. In: Radiation Effects on
Components and Systems, Third European Conference on, 1995, pages 9-18.
20. K. Makino, M. Berz, D. Errede, and C.J. Johnstone. Nonlinear transfer map treatment of beams through systems with
absorbing material. In: Physics and Control, 2003. Proceedings. 2003 International Conference, volume 3, 2003.
21. A. A. Hahn and J. R. Zagel. Observation of Bethe-Bloch ionization using the booster ion profile monitor. In: Particle
Accelerator Conference, volume 1, 1999, pages 468-470.
22. C. Detcheverry, C. Dachs, E. Lorfevre, C. Sudre, G. Bruguier, J.M. Palau, J. Gasiot, and R. Ecoffet. SEU critical charge
and sensitive area in a submicron CMOS technology. IEEE Transactions on Nuclear Science, 44(6), 1997, pages 2266–
2273.
23. K. Label and L. Cohn. Radiation testing and evaluation issues for modern integrated circuits. New Challenges for Radiation
Tolerance Assessment, Radiation Effects on Components and Systems, 2005, pages 71-93.
24. Кейси Х., Паниш М. Лазеры на гетероструктурах, М., Мир, 1981.
25. G. Messenger and M. Ash. The Effects of Radiation on Electronic Systems. Van Nostrand Reinhold Company Inc., 1986.
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