ABDULXAYEV, A. et al. 2026. INTERFACE STATES AND CHARGE FORMATION MECHANISMS IN TiO₂-BASED MIS STRUCTURES WITH A SiO₂ INTERFACIAL LAYER. «ACTA NUUz». 3, 3.2 (Jun. 2026), 509–512. DOI:https://doi.org/10.69617/nuuz.v3i3.2.13068.