Ёқуб ЭРГАШОВ, Н.М. et al. 2025. INVESTIGATION OF THE WIDTH OF THE TRANSITION LAYER IN A SILICIDE-SILICON BILAYER SYSTEM . «ACTA NUUz». 3, 3.1.1 (Jun. 2025), 440–443. DOI:https://doi.org/10.69617/nuuz.v3i3.1.1.8047.