ABDULXAYEV, A., MAMATKARIMOV, O., & FAZLIDDINOV, S. (2026). INTERFACE STATES AND CHARGE FORMATION MECHANISMS IN TiO₂-BASED MIS STRUCTURES WITH A SiO₂ INTERFACIAL LAYER. «ACTA NUUz», 3(3.2), 509–512. https://doi.org/10.69617/nuuz.v3i3.2.13068