ABDULXAYEV, Abrorbek; MAMATKARIMOV, Odiljon; FAZLIDDINOV, Salohiddin. INTERFACE STATES AND CHARGE FORMATION MECHANISMS IN TiO₂-BASED MIS STRUCTURES WITH A SiO₂ INTERFACIAL LAYER. «ACTA NUUz», [S. l.], v. 3, n. 3.2, p. 509–512, 2026. DOI: 10.69617/nuuz.v3i3.2.13068. Disponível em: http://journals.nuu.uz/index.php/actanuuz/article/view/13068. Acesso em: 6 jul. 2026.