MALLAYEV, Amin; SAYFULLOYEV, Shohruh. RAMAN ANALYSIS OF STRUCTURAL PROPERTIES OF COBALT-DOPED n-TYPE MONOCRYSTALLINE SILICON. «ACTA NUUz», [S. l.], v. 3, n. 3.2, p. 542–545, 2026. DOI: 10.69617/nuuz.v3i3.2.13109. Disponível em: http://journals.nuu.uz/index.php/actanuuz/article/view/13109. Acesso em: 7 nov. 2026.