NOIBA BOTIROVA, Jamoliddin MURODOV; SHAVKAT YULDASHEV, Azamatbek ARSLANOV. TAILORING MEMRISTIVE BEHAVIOR IN NIO THIN FILMS VIA POST-ANNEALING TIME AND ELECTRODE ENGINEERING . «ACTA NUUz», [S. l.], v. 3, n. 3.1.1, p. 433–436, 2025. DOI: 10.69617/nuuz.v3i3.1.1.8056. Disponível em: http://journals.nuu.uz/index.php/actanuuz/article/view/8056. Acesso em: 5 dec. 2025.