Ёкуб ЭРГАШОВ НМ, Сафарали КУЧАРОВ АТ, Хуснора НОРКУЛОВА. STUDY OF THE WIDTH OF THE TRANSITION LAYER OF A BILAYER SILICIDE-SILICON SYSTEM . NUUz [Internet]. 2025 May 14 [cited 2025 Dec. 5];3(3.1):380-2. Available from: http://journals.nuu.uz/index.php/actanuuz/article/view/7481