1.
Ёқуб ЭРГАШОВ НМ, Сафарали КУЧАРОВ АТ, Зуснора НОРКУЛОВА. INVESTIGATION OF THE WIDTH OF THE TRANSITION LAYER IN A SILICIDE-SILICON BILAYER SYSTEM . NUUz [Internet]. 2025 Jun. 30 [cited 2025 Dec. 5];3(3.1.1):440-3. Available from: http://journals.nuu.uz/index.php/actanuuz/article/view/8047