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EFFECT OF SN-CONCENTRATION ON THE MORPHOLOGICAL AND STRUCTURAL PROPERTIES OF SNO2/ZNO HETEROSTRUCTURES GROWN VIA USP

Ultrasonic Spray Pyrolysis, ZnO/SnO2 heterostructure, Degenerate semiconductor, Spectroscopic ellipsometry

Authors

  • Azim SOATOV PhD Candidate (Doctoral Researcher) Center for Development of Nanotechnologies, National University of Uzbekistan, Tashkent,, Uzbekistan
  • Abdumajit TURAYEV Center for Development of Nanotechnologies, National University of Uzbekistan, Tashkent, 100174, Uzbekistan., Uzbekistan

This study presents the successful synthesis of SnO2/ZnO bilayer heterostructures on p-Si(100) substrates via ultrasonic spray
pyrolysis (USP). Unlike conventional doping, this research focus on a functional dual-layer system with a high tin concentration
of 17.41 at.%. XRD analysis confirmed a hexagonal wurtzite structure with a dominant (002) c-axis orientation and an average
crystallite size of 39.8 nm. EDS verified the integration of SnO2 and ZnO phases, revealing 17.41 at.% Sn and 12.44 at.% Zn.
Spectroscopic ellipsometry, utilizing a SnO2/ZnO/SiO2/Si multilayer model, determined a total oxide thickness of 248.20 nm and
an effective refractive index of n = 1.9466 at 632.8 nm. The results demonstrate that USP-grown bilayers provide a robust, highly
transparent, and conductive alternative for advanced optoelectronic applications.