QIZDIRISH VA ELEKTROD MATERIALINI BOSHQARISH ORQALI NiO YUPQA QAVATLARIDA MEMRISTIV XATTI-HARAKATNI SHAKLLANTIRISH
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Nikel oksid (NiO) yupqa qatlamlari sol–gel aylantirish (spin-coating) usuli bilan sintez qilinib, 400 °C da 2 va 5 soat davomida termik ishlov berildi. Post-annealing (qayta qizdirish) vaqtining memristiv xatti-harakatga ta’sirini o‘rganish maqsad qilingan. Yuqori elektrod sifatida kumush (Ag) va indiy (In) materiallari ishlatildi. Optik energiya oralig‘i (bandgap) yutilish spektridan (reflectance) olingan Tauc grafiklari yordamida aniqlandi. Struktura xossalari rentgen difraksiyasi (XRD) orqali o‘rganildi, memristiv xatti-harakat esa Keithley-2460 SourceMeter qurilmasi yordamida tok–kuchlanish (I–V) o‘lchovlari orqali baholandi. Tadqiqot natijalari shuni ko‘rsatdiki, qizdirish vaqti hamda elektrod turi o’tish xatti-harakati va material xossalariga sezilarli darajada ta’sir qiladi.
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