NANOSTRUCTURED NIO THIN FILMS FABRICATED BY SOL–GEL SPIN COATING: STRUCTURAL AND OPTICAL PROPERTIES
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NiO thin films were deposited on SiO₂ substrate using the sol–gel spin coating method. The structural properties were analyzed by
X-ray diffraction (XRD), confirming the formation of polycrystalline NiO with a cubic phase. The crystallite size and microstrain
were evaluated using the Williamson–Hall approach, yielding an average crystallite size of approximately 48 nm and a microstrain
of 1.5 × 10⁻³. Surface morphology was examined by scanning electron microscopy (SEM), and the optical properties were
investigated using UV–Vis spectroscopy. The optical band gap was determined using the Tauc plot method. The obtained results
indicate that the prepared NiO thin films exhibit suitable structural and optical characteristics for potential applications in functional
devices.
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